Hello MAF team,
i am really interested in current offer for the MAF Three but i am missing some features and would like to know if something is planned on this on short/long term.
1. Scanning time with 4-5 seconds is quite high. For synchronized structured light scanner the scanning time should be around 1 second. Is it planned and possible to add synchronization of projected pattern and cameras in order to improve scanning time to about 1 second?
2. Turntable can only be calibrated using plate at the moment. Is is planned to add turntable axis calibration by object surface scan? This is very useful for feature rich objects where the object can remain on the turntable after adjusting scanner orientation (e.g. change tilt).
3. Is it possible to scan first the texture with turntable for 360° and then afterwards scan the surface with turntable for 360°. The advantage for such feature is to optimize the lightning environment especially for the texture scans (strong light) and object scan (low light). And it also allows to 1st scan the texture and then 2nd apply scanning spray for better quality on black, dark and glossy surface.
4. Any plans to allow optionally also post-processing of scanned data on PC? Meaning the MAF3 is only used passively to capture the data and send it to powerfull PC for post-processing (alignment, mesh creation, texture calculation). This will allow to process faster without beeing limited on data storage.
5. Is it planned to add marker detection? Using marker has lot of advantages especially when global marker detection is supported. Would be good to add such powerfull feature.
Please provide honest feedback if such featue are planned in the future.
Thanks for your reply.
Christian
